DYNAMIC RANDOM ACCESS MEMORY
Experts
- Onur Mutlu
- Koji Nii
- Toshiaki Kirihata
- Subramanian S. Iyer
- Jörg Henkel
- Meng-Fan Chang
- Makoto Yabuuchi
- Donghyuk Lee
- Hiroshi Kawaguchi
- Jonathan Chang
- Hasan Hassan
- Gregory Fredeman
- John Barth
- Masahiko Yoshimoto
- Yasumasa Tsukamoto
- Paul C. Parries
- Vivek Seshadri
- Thomas Toifl
- Vladimir Stojanovic
- Shimeng Yu
- Norbert Wehn
- Marcel A. Kossel
- Hongwu Jiang
- Fazal Hameed
- Steven J. E. Wilton
- Tadahiro Kuroda
- Hidehiro Fujiwara
- David T. Blaauw
- Yuan Xie
- Shanshi Huang
- Nam Sung Kim
- William R. Reohr
- Thomas Morf
- Christian Menolfi
- Kea-Tiong Tang
- Chih-Cheng Hsieh
- Jente B. Kuang
- Xin Si
- Kazutami Arimoto
Venues
- IEEE J. Solid State Circuits
- ISSCC
- CoRR
- CICC
- IEEE Trans. Very Large Scale Integr. Syst.
- DATE
- ISCAS
- DAC
- IBM J. Res. Dev.
- ESSCIRC
- ISCA
- ICCD
- ITC
- IEEE Micro
- ASP-DAC
- VLSI Technology and Circuits
- VLSI Design
- IEEE Trans. Circuits Syst. I Regul. Pap.
- IEEE Trans. Computers
- ISQED
- IEEE Trans. Circuits Syst. II Express Briefs
- ISLPED
- Microprocess. Microsystems
- MICRO
- ACM Great Lakes Symposium on VLSI
- VLSI Circuits
- HPCA
- A-SSCC
- Microelectron. J.
- IEEE Access
- ESSDERC
- SoCC
- VTS
- IEICE Trans. Electron.
- ICCAD
- VLSIC
- IOLTS
- ASICON
- IRPS
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