DYNAMIC RANDOM ACCESS MEMORY
Experts
- Onur Mutlu
- Koji Nii
- Toshiaki Kirihata
- Subramanian S. Iyer
- Jörg Henkel
- Makoto Yabuuchi
- Meng-Fan Chang
- Donghyuk Lee
- Masahiko Yoshimoto
- Hasan Hassan
- Jonathan Chang
- John Barth
- Gregory Fredeman
- Hiroshi Kawaguchi
- Yasumasa Tsukamoto
- Vladimir Stojanovic
- Thomas Toifl
- Vivek Seshadri
- Paul C. Parries
- Hongwu Jiang
- Thomas Morf
- Christian Menolfi
- Tadahiro Kuroda
- Yuan Xie
- Marcel A. Kossel
- Nam Sung Kim
- Shimeng Yu
- Hidehiro Fujiwara
- David T. Blaauw
- Norbert Wehn
- Steven J. E. Wilton
- Fazal Hameed
- Shanshi Huang
- William R. Reohr
- Jente B. Kuang
- Lars Bauer
- Yohei Nakata
- Abraham Mathews
- Mototsugu Hamada
Venues
- IEEE J. Solid State Circuits
- ISSCC
- CoRR
- CICC
- IEEE Trans. Very Large Scale Integr. Syst.
- ISCAS
- DATE
- DAC
- IBM J. Res. Dev.
- ISCA
- ESSCIRC
- ICCD
- IEEE Trans. Circuits Syst. II Express Briefs
- IEEE Micro
- ITC
- VLSI Technology and Circuits
- ASP-DAC
- VLSI Design
- IEEE Trans. Computers
- IEEE Trans. Circuits Syst. I Regul. Pap.
- ACM Great Lakes Symposium on VLSI
- HPCA
- ISQED
- ISLPED
- Microprocess. Microsystems
- A-SSCC
- IRPS
- MICRO
- VLSI Circuits
- Microelectron. J.
- IEICE Trans. Electron.
- VTS
- ICCAD
- ESSDERC
- IEEE Access
- SoCC
- ISOCC
- VLSIC
- IEICE Electron. Express
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