On the Automation of the Test Flow of Complex SoCs.
Davide AppelloVincenzo TancorrePaolo BernardiMichelangelo GrossoMaurizio RebaudengoMatteo Sonza ReordaPublished in: VTS (2006)
Keyphrases
- complex data
- databases
- neural network
- information systems
- feature selection
- computationally expensive
- complex systems
- test cases
- flow patterns
- data sets
- flow field
- test data
- higher level
- probabilistic model
- information technology
- expert systems
- multiscale
- similarity measure
- high level
- image processing
- artificial intelligence
- real world