MTDT

Keyphrases

Publications

2006

Jörg E. Vollrath, Jürg Schwizer, Marcin Gnat, Ralf Schneider, Bret Johnson
DDR2 DRAM Output Timing Optimization. MTDT (2006)
Jia-Lin Wu, Hua-Ching Chien, Chien-Wei Liao, Cheng-Yen Wu, Chih-Yuan Lee, Houng-Chi Wei, Shih-Hsien Chen, Hann-Ping Hwang, Saysamone Pittikoun, Travis Cho, Chin-Hsing Kao
Comparison of Electrical and Reliability Characteristics of Different Tunnel Oxides in SONOS Flash Memory. MTDT (2006)
Victor Chao-Wei Kuo, Chih-Ming Chao, Chih-Kai Kang, Li-Wei Liu, Tzung-Bin Huang, Liang-Tai Kuo, Shi-Hsien Chen, Houng-Chi Wei, Hann-Ping Hwang, Saysamone Pittikoun
Detailed Comparisons of Program, Erase and Data Retention Characteristics between P+- and N+-Poly SONOS NAND Flash Memory. MTDT (2006)
Riichiro Shirota
Roadmap of the Flash Memory. MTDT (2006)
Jordan Lai
SRAM Design Techniques for Sub-nano CMOS Technology. MTDT (2006)
Hua Wang, Miguel Miranda, Francky Catthoor, Wim Dehaene
On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components. MTDT (2006)
Foreword. MTDT (2006)
Mu-Hsien Hsu, Yu-Tsao Hsing, Jen-Chieh Yeh, Cheng-Wen Wu
Fault-Pattern Oriented Defect Diagnosis for Flash Memory. MTDT (2006)
Peter Muhmenthaler
New on-Chip DFT and ATE Features for Efficient Embedded Memory Test. MTDT (2006)
Chih-Yuan Lu
Non-volatile Semiconductor Memory Technology in Nanotech Era. MTDT (2006)
Yuui Shimizu, Hisanori Aikawa, Keiji Hosotani, Naoharu Shimomura, Tadashi Kai, Yoshihiro Ueda, Yoshiaki Asao, Yoshihisa Iwata, Kenji Tsuchida, Sumio Ikegawa
MRAM Write Error Categorization with QCKB. MTDT (2006)
Reviewers. MTDT (2006)
Shen-Fu Hsiao, Yo-Chi Chen, Ming-Yu Tsai, Tze-Chong Cheng
Novel Memory Organization and Circuit Designs for Efficient Data Access in Applications of 3D Graphics and Multimedia Coding. MTDT (2006)
Pei-Lin Pai
DRAM Industry Trend. MTDT (2006)
Charles Hsu
Future Prospective of Programmable Logic Non-volatile Device. MTDT (2006)
Organizing Committee. MTDT (2006)
Ding-Ming Kwai, Yung-Fa Chou, Meng-Fan Chang, Su-Meng Yang, Ding-Sheng Chen, Min-Chung Hsu, Yu-Zhen Liao, Shiao-Yi Lin, Yu-Ling Sung, Chia-Hsin Lee, Hsin-Kun Hsu
FlexiVia ROM Compiler Programmable on Different Via Layers Based on Top Metal Assignment. MTDT (2006)
Program Committee. MTDT (2006)
Ding-Ming Kwai, Ching-Hua Hsiao, Chung-Ping Kuo, Chi-Hsien Chuang, Min-Chung Hsu, Yi-Chun Chen, Yu-Ling Sung, Hsien-Yu Pan, Chia-Hsin Lee, Meng-Fan Chang, Yung-Fa Chou
SRAM Cell Current in Low Leakage Design. MTDT (2006)
14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan MTDT (2006)
Mohamed Azimane
High-Quality Memory Test. MTDT (2006)
Hsing-Chung Liang, Le-Quen Tzeng
Improved Representatives for Unrepairability Judging and Economic Repair Solutions of Memories. MTDT (2006)
T. A. Gyonjyan, Gurgen Harutunyan, Valery A. Vardanian
A March-Based Algorithm for Location and Full Diagnosis of All Unlinked Static Faults. MTDT (2006)
Jyi-Tsong Lin, Mike Chang
A New 1T DRAM Cell With Enhanced Floating Body Ef. MTDT (2006)
Mohammad Sharifkhani, Shah M. Jahinuzzaman, Manoj Sachdev
Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests. MTDT (2006)

2005