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A P1500 Compliant BIST-Based Approach to Embedded RAM Diagnosis.
Davide Appello
Fulvio Corno
M. Giovinetto
Maurizio Rebaudengo
Matteo Sonza Reorda
Published in:
Asian Test Symposium (2001)
Keyphrases
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model based diagnosis
automatic diagnosis
database
fault diagnosis
embedded systems
medical diagnosis
multiple faults
real time
neural network
computer vision
causal reasoning
root cause
diagnostic tests