Bram Kruseman

Publication Activity (10 Years)

Years Active: 1999-2016
Publications (10 Years): 2

Top Topics

Clinically Relevant

Analog Circuits

Top Venues

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.

IEEE Des. Test Comput.

IEEE Trans. Instrum. Meas.

Publications

Said Hamdioui, Giorgio Di Natale, Bram Kruseman, Maria K. Michael, Haralampos-G. D. Stratigopoulos
ETS 2016 foreword. ETS (2016)
Bram Kruseman
Testing of Analog/Mixed Signal ICs: Past, present and future. ETS (2015)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (2) (2013)
Said Hamdioui, Davide Appello, Arnaud Grasset, Xinli Gu, Bram Kruseman, Riccardo Mariani, Hermann Obermeir, Srikanth Venkataraman
Panel session what is the electronics industry doing to win the battle against the expected scary failure rates in future technology nodes? ETS (2013)
Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (5) (2012)
Ke Huang, Haralampos-G. D. Stratigopoulos, Salvador Mir, Camelia Hora, Yizi Xing, Bram Kruseman
Diagnosis of Local Spot Defects in Analog Circuits. IEEE Trans. Instrum. Meas. 61 (10) (2012)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for Analog/Mixed-Signal Designs. IEEE Des. Test Comput. 29 (5) (2012)
Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT (2011)
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, Yizi Xing
Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. DATE (2011)
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, Yizi Xing
Defect Oriented Testing for analog/mixed-signal devices. ITC (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 30 (12) (2011)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Gate Leakage Impact on Full Open Defects in Interconnect Lines. IEEE Trans. Very Large Scale Integr. Syst. 19 (12) (2011)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Diagnosis of full open defects in interconnect lines with fan-out. ETS (2010)
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, V. Kamakoti
Impact of Temperature on Test Quality. VLSI Design (2010)
Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel
NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE (2010)
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, Ananta K. Majhi
Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality. ITC (2008)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Full Open Defects in Nanometric CMOS. VTS (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman
Time-dependent Behaviour of Full Open Defects in Interconnect Lines. ITC (2008)
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Full Open Defects in Interconnecting Lines. VTS (2007)
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, Ananta K. Majhi
Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. VTS (2007)
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24 (3) (2007)
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
On Performance Testing with Path Delay Patterns. VTS (2007)
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
Power Supply Noise in Delay Testing. ITC (2006)
Bram Kruseman, Manuel Heiligers
On test conditions for the detection of open defects. DATE (2006)
Bart Vermeulen, Camelia Hora, Bram Kruseman, Erik Jan Marinissen, Robert Van Rijsinge
Trends in Testing Integrated Circuits. ITC (2004)
Bram Kruseman, Ananta K. Majhi, Camelia Hora, Stefan Eichenberger, Johan Meirlevede
Systematic Defects in Deep Sub-Micron Technologies. ITC (2004)
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
On Hazard-free Patterns for Fine-delay Fault Testing. ITC (2004)
Bram Kruseman, Stefan van den Oetelaar
Detection of Resistive Shorts in Deep Sub-micron Technologies. ITC (2003)
Bram Kruseman, Stefan van den Oetelaar, Josep Rius
Comparison of IDDQ Testing and Very-Low Voltage Testing. ITC (2002)
Bram Kruseman, Rudger van Veen, Kees van Kaam
The future of delta I_DDQ testing. ITC (2001)
Bram Kruseman
Comparison of defect detection capabilities of current-based and voltage-based test methods. ETW (2000)
Bram Kruseman, Peter Janssen, Victor Zieren
Transient current testing of 0.25 μm CMOS devices. ITC (1999)