Detection of Resistive Shorts in Deep Sub-micron Technologies.
Bram KrusemanStefan van den OetelaarPublished in: ITC (2003)
Keyphrases
- automatic detection
- data mining
- object detection
- false positives
- detection algorithm
- detection method
- neural network
- emerging technologies
- learning environment
- false alarms
- detection rate
- electron beam
- data sets
- detection scheme
- future development
- st century
- event detection
- learning systems
- human computer interaction
- medical images
- three dimensional
- real world
- databases