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Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
Hamidreza Hashempour
Jos Dohmen
Bratislav Tasic
Bram Kruseman
Camelia Hora
Maikel van Beurden
Yizi Xing
Published in:
DATE (2011)
Keyphrases
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test cases
mixed signal
test data
software testing
test generation
vlsi circuits
statistical tests
mobile devices
low power
multi channel
test suite