Diagnosis of Local Spot Defects in Analog Circuits.
Ke HuangHaralampos-G. D. StratigopoulosSalvador MirCamelia HoraYizi XingBram KrusemanPublished in: IEEE Trans. Instrum. Meas. (2012)
Keyphrases
- analog circuits
- fault diagnosis
- fault detection
- digital circuits
- neural network
- model based diagnosis
- wavelet packet transform
- multiple faults
- expert systems
- fuzzy logic
- model based reasoning
- defect detection
- defect classification
- clinically relevant
- image restoration
- xml documents
- decision making
- spot detection
- artificial intelligence