Guido Gronthoud

Publication Activity (10 Years)

Years Active: 2000-2012
Publications (10 Years): 0

Top Venues

J. Electron. Test.

Publications

Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus. J. Electron. Test. 28 (4) (2012)
Xiaoqin Sheng, Hans G. Kerkhoff, Amir Zjajo, Guido Gronthoud
Algorithms for ADC Multi-site Test with Digital Input Stimulus. ETS (2009)
Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. ETS (2008)
Jens Anders, Shaji Krishnan, Guido Gronthoud
Re-configuration of sub-blocks for effective application of time domain tests. DATE (2007)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory Testing Under Different Stress Conditions: An Industrial Evaluation CoRR (2007)
Jing Wang, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, Stefan Eichenberger
Modeling Power Supply Noise in Delay Testing. IEEE Des. Test Comput. 24 (3) (2007)
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud
On Performance Testing with Path Delay Patterns. VTS (2007)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
Extending gate-level diagnosis tools to CMOS intra-gate faults. IET Comput. Digit. Tech. 1 (6) (2007)
Jing Wang, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, Stefan Eichenberger
Power Supply Noise in Delay Testing. ITC (2006)
Xinyue Fan, Will R. Moore, Camelia Hora, Mario Konijnenburg, Guido Gronthoud
A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis. VTS (2006)
Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud
Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. J. Electron. Test. 22 (4-6) (2006)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
Stuck-open fault diagnosis with stuck-at model. ETS (2005)
Estella Silva, José Pineda de Gyvez, Guido Gronthoud
Functional vs. multi-VDD testing of RF circuits. ITC (2005)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory testing improvements through different stress conditions. ESSCIRC (2005)
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, Fred Bowen
Memory Testing Under Different Stress Conditions: An Industrial Evaluation. DATE (2005)
José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
Multi-VDD Testing for Analog Circuits. J. Electron. Test. 21 (3) (2005)
Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud
A novel stuck-at based method for transistor stuck-open fault diagnosis. ITC (2005)
Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, Maurice Lousberg
A New Algorithm for Dynamic Faults Detection in RAMs. VTS (2005)
Bram Kruseman, Ananta K. Majhi, Guido Gronthoud, Stefan Eichenberger
On Hazard-free Patterns for Fine-delay Fault Testing. ITC (2004)
José Pineda de Gyvez, Guido Gronthoud, Cristiano Cenci, Martin Posch, Thomas Burger, Manfred Koller
Power Supply Ramping for Quasi-static Testing of PLLs. ITC (2004)
José Pineda de Gyvez, Guido Gronthoud, Rashid Amine
VDD Ramp Testing for RF Circuits. ITC (2003)
Daniel Arumí-Delgado, Rosa Rodríguez-Montañés, José Pineda de Gyvez, Guido Gronthoud
and weak-open defects. ETW (2003)
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, Stefan Eichenberger
Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model. VTS (2003)
Liquan Fang, Guido Gronthoud, Hans G. Kerkhoff
Reducing analogue fault-simulation time by using high-level modelling in dotss for an industrial design. ETW (2001)
Will R. Moore, Guido Gronthoud, Keith Baker, Maurice Lousberg
Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything? ITC (2000)