Extending gate-level diagnosis tools to CMOS intra-gate faults.

Xinyue Fan Will R. Moore Camelia Hora Guido Gronthoud

Published in: IET Comput. Digit. Tech. (2007)

Keyphrases

fault diagnosis
cmos technology
model based diagnosis
fault detection
multiple faults
nano scale
nm technology
power consumption
medical diagnosis
multiple input
low power
high speed
user friendly
expert systems
fault model
software tools
low cost
fuzzy logic