Frans G. M. de Jong

Publication Activity (10 Years)

Years Active: 1990-2008
Publications (10 Years): 0

Publications

Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong
Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design. ETS (2008)
Alex S. Biewenga, Frans G. M. de Jong
SiP-test: Predicting delivery quality. ITC (2007)
Frans G. M. de Jong, Alex S. Biewenga
SiP-TAP: JTAG for SiP. ITC (2006)
Frans G. M. de Jong, Leon van de Logt
IEEE P1581: To Live or Let die? ITC (2003)
Wouter Rijckaert, Frans G. M. de Jong
Board Test Coverage: The Value of Prediction and How to Compare Numbers. ITC (2003)
Rodger Schuttert, Frans G. M. de Jong, Ben Kup
Improved Test Monitor Circuit in Power Pin DfT. VTS (2002)
Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers
Testing and programming flash memories on assemblies during high volume production. ITC (2001)
D. C. L. (Erik) van Geest, Frans G. M. de Jong
System-level DFT for consumer products. ETW (2001)
Frans G. M. de Jong, Ben Kup, Rodger Schuttert
Power pin testing: making the test coverage complete. ITC (2000)
Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg
Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC (1999)
Frans G. M. de Jong, Rob Raaijmakers
Static component interconnection test technology in practice. ITC (1999)
Frans G. M. de Jong
SCITT: Back to Basics in Mass Production Testing. ITC (1999)
Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden
Memory Interconnection Test at Board Level. ITC (1992)
Frans G. M. de Jong, Frank van der Heyden
Testing the Integrity of the Boundary Scan Test Infrastructure. ITC (1991)
Frans G. M. de Jong
Boundary scan test used at board level: moving towards reality. ITC (1990)