Power pin testing: making the test coverage complete.
Frans G. M. de JongBen KupRodger SchuttertPublished in: ITC (2000)
Keyphrases
- test suite
- code coverage
- test cases
- set of test cases
- software testing
- test generation
- regression testing
- test data
- test sequences
- testing process
- software systems
- test case generation
- white box testing
- number of test cases
- item response theory
- usability testing
- test data generation
- real time
- test driven development
- neural network
- data mining
- genetic algorithm
- integration testing
- decision making
- knowledge base
- statistical significance
- bayesian networks
- data structure
- video sequences
- object oriented
- quality assurance
- statistical tests