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Testing and programming flash memories on assemblies during high volume production.

Frans G. M. de JongAlex S. BiewengaD. C. L. (Erik) van GeestT. F. Waayers
Published in: ITC (2001)
Keyphrases
  • high volume
  • big data
  • real time
  • programming language
  • test cases
  • data mining
  • case study