Alex S. Biewenga

Publication Activity (10 Years)

Years Active: 1993-2007
Publications (10 Years): 0

Publications

Alex S. Biewenga, Frans G. M. de Jong
SiP-test: Predicting delivery quality. ITC (2007)
Frans G. M. de Jong, Alex S. Biewenga
SiP-TAP: JTAG for SiP. ITC (2006)
Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers
Testing and programming flash memories on assemblies during high volume production. ITC (2001)
Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg
Static component interconnect test technology (SCITT) a new technology for assembly testing. ITC (1999)
Alex S. Biewenga, Math Muris, Rodger Schuttert, Urs Fawer
Testing a multichip package for a consumer communications application. ITC (1998)
Math Muris, Alex S. Biewenga
Using Boundary Scan Test to Test Random Access Memory Clusters. ITC (1993)