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Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
Will R. Moore
Guido Gronthoud
Keith Baker
Maurice Lousberg
Published in:
ITC (2000)
Keyphrases
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fault model
fault diagnosis
fault detection
fault injection
real time embedded systems
genetic algorithm
test cases
software testing
software development life cycle
information systems
feature extraction
test set
deep learning
defect detection
failure modes
defect classification