Multi-VDD Testing for Analog Circuits.

José Pineda de Gyvez Guido Gronthoud Rashid Amine

Published in: J. Electron. Test. (2005)

Keyphrases

analog circuits
fault diagnosis
digital circuits
test set
wavelet packet transform
neural network
knowledge base
expert systems
real time
test cases
artificial intelligence
genetic algorithm
heuristic search
parallel computing
software testing
machine learning
data sets