VDD Ramp Testing for RF Circuits.

José Pineda de Gyvez Guido Gronthoud Rashid Amine

Published in: ITC (2003)

Keyphrases

test cases
radio frequency
artificial intelligence
expert systems
data sets
vlsi circuits
logic synthesis
similarity measure
low cost
high speed
tunnel diode
high level synthesis
asynchronous circuits
test generation
frequency band
relevance feedback
training data
website
computer vision
machine learning
databases