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Modeling Power Supply Noise in Delay Testing.

Jing WangDuncan M. Hank WalkerXiang LuAnanta K. MajhiBram KrusemanGuido GronthoudLuis Elvira VillagraPaul J. A. M. van de WielStefan Eichenberger
Published in: IEEE Des. Test Comput. (2007)
Keyphrases
  • power supply
  • intelligent control
  • genetic algorithm
  • decision making
  • high frequency
  • control unit
  • high power
  • rbf neural network
  • electrical power