Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.
Amir ZjajoJosé Pineda de GyvezGuido GronthoudPublished in: J. Electron. Test. (2006)
Keyphrases
- fault detection
- integrated circuit
- fault diagnosis
- neyman pearson
- industrial processes
- tennessee eastman
- fault identification
- condition monitoring
- robust fault detection
- fault localization
- fault detection and isolation
- fault detection and diagnosis
- fault isolation
- failure detection
- power plant
- fuel cell
- artificial intelligence
- electron beam
- mathematical models
- decision support system
- management system
- artificial neural networks
- feature space
- machine learning