Full Open Defects in Nanometric CMOS.

Daniel Arumí Rosa Rodríguez-Montañés Joan Figueras Stefan Eichenberger Camelia Hora Bram Kruseman

Published in: VTS (2008)

Keyphrases

low cost
high speed
power consumption
defect detection
machine learning
low power
databases
information retrieval
knowledge base
image processing
feature extraction
vlsi circuits
defect classification