Sign in

Full Open Defects in Nanometric CMOS.

Daniel ArumíRosa Rodríguez-MontañésJoan FiguerasStefan EichenbergerCamelia HoraBram Kruseman
Published in: VTS (2008)
Keyphrases
  • low cost
  • high speed
  • power consumption
  • defect detection
  • machine learning
  • low power
  • databases
  • information retrieval
  • knowledge base
  • image processing
  • feature extraction
  • vlsi circuits
  • defect classification