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Defect Oriented Testing for analog/mixed-signal devices.

Bram KrusemanBratislav TasicCamelia HoraJos DohmenHamidreza HashempourMaikel van BeurdenYizi Xing
Published in: ITC (2011)
Keyphrases
  • mixed signal
  • low power
  • multi channel
  • vlsi circuits
  • digital circuits
  • power consumption
  • high speed
  • cmos technology
  • low cost
  • mobile devices
  • low voltage
  • single chip
  • digital images
  • analog to digital converter
  • real time