NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.
Elif AlpaslanBram KrusemanAnanta K. MajhiWilmar M. HeuvelmanJennifer DworakPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)