NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.

Elif Alpaslan Bram Kruseman Ananta K. Majhi Wilmar M. Heuvelman Jennifer Dworak

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2012)

Keyphrases

multiresolution

cluster analysis