Login / Signup

Gate Leakage Impact on Full Open Defects in Interconnect Lines.

Daniel ArumíRosa Rodríguez-MontañésJoan FiguerasStefan EichenbergerCamelia HoraBram Kruseman
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
  • high speed
  • leakage current
  • hough transform
  • genetic algorithm
  • knowledge base
  • case study
  • line segments
  • d objects
  • markov chain
  • automated visual inspection