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Defect Oriented Testing for Analog/Mixed-Signal Designs.
Bram Kruseman
Bratislav Tasic
Camelia Hora
Jos Dohmen
Hamidreza Hashempour
Maikel van Beurden
Yizi Xing
Published in:
IEEE Des. Test Comput. (2012)
Keyphrases
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mixed signal
low power
multi channel
vlsi circuits
digital circuits
low cost
power consumption
cmos technology
high speed
low voltage
analog to digital converter
test cases
model checking