Login / Signup
An Optimized Test During Burn-In for Automotive SoC.
Davide Appello
Conrad Bugeja
Giorgio Pollaccia
Paolo Bernardi
Riccardo Cantoro
Marco Restifo
Ernesto Sánchez
Federico Venini
Published in:
IEEE Des. Test (2018)
Keyphrases
</>
test data
information retrieval
pairwise
artificial neural networks
automotive industry
real time
search engine
information systems
website
decision trees
multiresolution
hidden markov models
test cases
hardware and software