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Automotive IC's: less testing, more prevention.

Davide Appello
Published in: ITC (2007)
Keyphrases
  • data sets
  • case study
  • search algorithm
  • test cases
  • integrated circuit
  • automotive industry
  • real world
  • machine learning
  • genetic algorithm
  • multiscale
  • preprocessing
  • trade off
  • evolutionary algorithm
  • test data