Kenneth M. Butler

Publication Activity (10 Years)

Years Active: 1988-2017
Publications (10 Years): 3

Top Topics

Analog Circuits

Top Venues

J. Electron. Test.

Publications

Li Xu, Yuming Zhuang, Rajavelu Thinakaran, Kenneth M. Butler, Degang Chen
Accurate ADC testing with significantly relaxed instrumentation including large cumulative jitter. ITC (2017)
Kenneth M. Butler, Amit Nahar, W. Robert Daasch
What we know after twelve years developing and deploying test data analytics solutions. ITC (2016)
David Shaw, Dirk Hoops, Kenneth M. Butler, Amit Nahar
Statistical outlier screening as a test solution health monitor. ITC (2016)
Hugo R. Gonçalves, Xin Li, Miguel V. Correia, Vítor Tavares, John M. Carulli Jr., Kenneth M. Butler
A fast spatial variation modeling algorithm for efficient test cost reduction of analog/RF circuits. DATE (2015)
Shanghang Zhang, Xin Li, Ronald D. Blanton, José Machado da Silva, John M. Carulli Jr., Kenneth M. Butler
Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling. ITC (2014)
Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler
Test data analytics - Exploring spatial and test-item correlations in production test data. ITC (2013)
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
Adaptive quality binning for analog circuits. ETS (2013)
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
Efficient Process Shift Detection and Test Realignment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (12) (2013)
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring. IEEE Trans. Very Large Scale Integr. Syst. 21 (6) (2013)
Senthil Arasu, Mehrdad Nourani, John M. Carulli, Kenneth M. Butler, Vijay Reddy
A design-for-reliability approach based on grading library cells for aging effects. ITC (2013)
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29 (6) (2013)
Jayanand Asok Kumar, Kenneth M. Butler, Heesoo Kim, Shobha Vasudevan
Early prediction of NBTI effects using RTL source code analysis. DAC (2012)
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
Adaptive multidimensional outlier analysis for analog and mixed signal circuits. ITC (2011)
Kapil R. Gotkhindikar, W. Robert Daasch, Kenneth M. Butler, John M. Carulli Jr., Amit Nahar
Die-level adaptive test: Real-time test reordering and elimination. ITC (2011)
Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler
Test cost reduction through performance prediction using virtual probe. ITC (2011)
Erik Jan Marinissen, Adit D. Singh, Dan Glotter, Marco Esposito, John M. Carulli Jr., Amit Nahar, Kenneth M. Butler, Davide Appello, Chris Portelli
Adapting to adaptive testing. DATE (2010)
Ender Yilmaz, Sule Ozev, Kenneth M. Butler
Adaptive test flow for mixed-signal/RF circuits using learned information from device under test. ITC (2010)
Mohammad Tehranipoor, Kenneth M. Butler
Power Supply Noise: A Survey on Effects and Research. IEEE Des. Test Comput. 27 (2) (2010)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena, Amit Nahar, W. Robert Daasch
Multidimensional Test Escape Rate Modeling. IEEE Des. Test Comput. 26 (5) (2009)
Amit Nahar, Kenneth M. Butler, John M. Carulli Jr., Charles Weinberger
Quality improvement and cost reduction using statistical outlier methods. ICCD (2009)
Kenneth M. Butler, John M. Carulli Jr., Jayashree Saxena
Modeling Test Escape Rate as a Function of Multiple Coverages. ITC (2008)
Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 26 (5) (2007)
Mohammad Tehranipoor, Kenneth M. Butler
Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs. IEEE Des. Test Comput. 24 (3) (2007)
Kenneth M. Butler
Guest Editor's Introduction: ITC Helps Get More Out of Test. IEEE Des. Test Comput. 23 (5) (2006)
Kenneth M. Butler
Sure You Can Get to 100 DPPM in Deep Submicron, But It'll Cost Ya. ITC (2004)
Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC (2004)
Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger
A Case Study of IR-Drop in Structured At-Speed Testing. ITC (2003)
Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang
Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs. IEEE Des. Test Comput. 20 (5) (2003)
Kenneth M. Butler
Is ITC Bored with Board Test? ITC (2002)
Jayashree Saxena, Kenneth M. Butler, John Gatt, R. Raghuraman, Sudheendra Phani Kumar, Supatra Basu, David J. Campbell, John Berech
Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges . ITC (2002)
Hari Balachandran, Kenneth M. Butler, Neil Simpson
Facilitating Rapid First Silicon Debug. ITC (2002)
Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang
Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Des. Test Comput. 18 (1) (2001)
Jayashree Saxena, Kenneth M. Butler, Lee Whetsel
An analysis of power reduction techniques in scan testing. ITC (2001)
Frank F. Hsu, Kenneth M. Butler, Janak H. Patel
A case study on the implementation of the Illinois Scan Architecture. ITC (2001)
Jayashree Saxena, Kenneth M. Butler
An empirical study on the effects of test type ordering on overall test efficiency. ITC (2000)
Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC (2000)
Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS (1999)
Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala
Expediting ramp-to-volume production. ITC (1999)
Kenneth M. Butler
Estimating the Economic Benefits of DFT. IEEE Des. Test Comput. 16 (1) (1999)
Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith
Correlation of logical failures to a suspect process step. ITC (1999)
Kenneth M. Butler
A study of test quality/tester scan memory trade-offs using the SEMATECH test methods data. ITC (1999)
Kenneth M. Butler
The stuck-at fault: it ain't over 'til it's over. ITC (1998)
Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess
On applying non-classical defect models to automated diagnosis. ITC (1998)
David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, Jayashree Saxena, Kenneth M. Butler
Bridging Fault Diagnosis in the Absence of Physical Information. ITC (1997)
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena
Automated Diagnosis in Testing and Failure Analysis. IEEE Des. Test Comput. 14 (3) (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken, Wojciech Maly
So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment. ITC (1997)
Phil Nigh, Wayne M. Needham, Kenneth M. Butler, Peter C. Maxwell, Robert C. Aitken
An experimental study comparing the relative effectiveness of functional, scan, IDDq and delay-fault testing. VTS (1997)
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, Jayashree Saxena
Integrating Automated Diagnosis into the Testing and Failure Analysis Operations. ITC (1996)
Graham Hetherington, Greg Sutton, Kenneth M. Butler, Theo J. Powell
Test Generation and Design for Test for a Large Multiprocessing DSP. ITC (1995)
Kenneth M. Butler
Deep Submicron: Is Test Up to the Challenge? ITC (1995)
Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry
Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. VTS (1994)
Kenneth M. Butler, Rohit Kapur, M. Ray Mercer, Don E. Ross
The roles of controllability and observability in design for test. VTS (1992)
Don E. Ross, Kenneth M. Butler, Rohit Kapur, M. Ray Mercer
Fast functional evaluation of candidate OBDD variable orderings. EURO-DAC (1991)
Don E. Ross, Kenneth M. Butler, M. Ray Mercer
Exact ordered binary decision diagram size when representing classes of symmetric functions. J. Electron. Test. 2 (3) (1991)
Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer
Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC (1991)
Kenneth M. Butler, M. Ray Mercer
The Influences of Fault Type and Topology on Fault Model Performance and the Implications to Test and Testable Design. DAC (1990)
Rhonda Kay Gaede, Don E. Ross, M. Ray Mercer, Kenneth M. Butler
CATAPULT: Concurrent Automatic Testing Allowing Parallelization and Using Limited Topology. DAC (1988)