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Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.
Ender Yilmaz
Sule Ozev
Kenneth M. Butler
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
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floating gate
analog vlsi
analog circuits
circuit design
case study
built in self test
signal processing
statistical tests
data conversion
neural network
video sequences
artificial neural networks
relevance feedback
test data
parallel processing
information theory