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Correlating defect level to final test fault coverage for modular structured designs [microcontroller family].

Theo J. PowellKenneth M. ButlerMike AlesRoy HaleyMark Perry
Published in: VTS (1994)
Keyphrases
  • low cost
  • neural network
  • special case
  • design considerations
  • data sets
  • software development
  • higher level
  • test cases
  • modular structure