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Ken Moushegian
Publication Activity (10 Years)
Years Active: 2013-2013
Publications (10 Years): 0
Top Topics
High Voltage
Test Data
Model Based Diagnosis
Fault Model
Top Venues
J. Electron. Test.
VLSI Design
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Publications
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Sukeshwar Kannan
,
Bruce C. Kim
,
Anurag Gupta
,
Friedrich Taenzler
,
Richard Antley
,
Ken Moushegian
Physics Based Fault Models for Testing High-Voltage LDMOS.
VLSI Design
(2013)
Sukeshwar Kannan
,
Kaushal Kannan
,
Bruce C. Kim
,
Friedrich Taenzler
,
Richard Antley
,
Ken Moushegian
,
Kenneth M. Butler
,
Doug Mirizzi
Physics-Based Low-Cost Test Technique for High Voltage LDMOS.
J. Electron. Test.
29 (6) (2013)