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Physics Based Fault Models for Testing High-Voltage LDMOS.

Sukeshwar KannanBruce C. KimAnurag GuptaFriedrich TaenzlerRichard AntleyKen Moushegian
Published in: VLSI Design (2013)
Keyphrases
  • high voltage
  • fault models
  • fault model
  • operating conditions
  • model based diagnosis
  • normal operation
  • partial discharge
  • test data
  • real time
  • information systems
  • expert systems
  • knowledge based systems
  • test cases