Bruce C. Kim

Publication Activity (10 Years)

Years Active: 1991-2018
Publications (10 Years): 5

Top Topics

Primary Purpose

Contourlet Transform

Top Venues

J. Electron. Test.

Publications

Bruce C. Kim, Sang-Bock Cho
Design of 3D Inductors for IoT Security. ISOCC (2018)
Saikat Mondal, Sang-Bock Cho, Bruce C. Kim
Modeling and Crosstalk Evaluation of 3-D TSV-Based Inductor With Ground TSV Shielding. IEEE Trans. Very Large Scale Integr. Syst. 25 (1) (2017)
Bruce C. Kim, Sang-Bock Cho
Recent advances in TSV inductors for 3D IC technology. ISOCC (2016)
Hyun-Tae Kim, Jin-Seong Jeong, Bruce C. Kim, Sang-Bock Cho
Text information acquisition method of traffic signs for autonomous navigation. APCCAS (2016)
Jin-Seong Jeong, Hyun-Tae Kim, Bruce C. Kim, Sang-Bock Cho
Wide rear vehicle recognition using a fisheye lens camera image. APCCAS (2016)
Bruce C. Kim, Saikat Mondal, Friedrich Taenzler, Kenneth Moushegian
A novel BIST technique for LDMOS drivers. MWSCAS (2014)
Anurag Gupta, Mitchell Spryn, Bruce C. Kim, Eugene Edwards, Christina Brantley, Paul Ruffin
Design of nanosensing platform based on zinc oxide nanowire arrays. ISCAS (2013)
Kaushal Kannan, Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho
Development of hybrid electrical model for CNT based Through Silicon Vias. ISCAS (2013)
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Friedrich Taenzler, Richard Antley, Ken Moushegian
Physics Based Fault Models for Testing High-Voltage LDMOS. VLSI Design (2013)
Sukeshwar Kannan, Kaushal Kannan, Bruce C. Kim, Friedrich Taenzler, Richard Antley, Ken Moushegian, Kenneth M. Butler, Doug Mirizzi
Physics-Based Low-Cost Test Technique for High Voltage LDMOS. J. Electron. Test. 29 (6) (2013)
Sukeshwar Kannan, Bruce C. Kim, Byoungchul Ahn
Fault Modeling and Multi-Tone Dither Scheme for Testing 3D TSV Defects. J. Electron. Test. 28 (1) (2012)
Sukeshwar Kannan, Bruce C. Kim, Sang-Bock Cho, Byoungchul Ahn
Analysis of propagation delay in 3 - D stacked DRAM. ISCAS (2012)
Sukeshwar Kannan, Bruce C. Kim, Anurag Gupta, Seok-Ho Noh, Li Li, Sang-Bock Cho
Modeling and characterization of CNT-based TSV for high frequency applications. ISCAS (2012)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzler, Richard Antley, Craig Force
Embedded RF Circuit Diagnostic Technique with Multi-Tone Dither Scheme. J. Electron. Test. 27 (3) (2011)
Sukeshwar Kannan, Bruce C. Kim, Ganesh Srinivasan, Friedrich Taenzlar, Richard Antley, Craig Force, Falah Mohammed
RADPro: Automatic RF analyzer and diagnostic program generation tool. ITC (2010)
Sukeshwar Kannan, Bruce C. Kim
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards. ITC (2009)
Bruce C. Kim, Craig Force
Guest Editors' Introduction: The Evolution of RFIC Design and Test. IEEE Des. Test Comput. 25 (1) (2008)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 25 (1) (2008)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 25 (2) (2008)
Bruce C. Kim
Test Technology Newsletter April 2007. J. Electron. Test. 23 (2-3) (2007)
Bruce C. Kim
Test Technology Newsletter - December 2007. J. Electron. Test. 23 (6) (2007)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 24 (3) (2007)
Bruce C. Kim
Test Technology TC Newsletter. IEEE Des. Test Comput. 24 (2) (2007)
Bruce C. Kim
Test Technology Newsletter. J. Electron. Test. 23 (1) (2007)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 24 (5) (2007)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 24 (1) (2007)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 24 (6) (2007)
Srividya Sundar, Bruce C. Kim, Toby Byrd, Felipe Toledo, Sudhir Wokhlu, Erika Beskar, Raul Rousselin, David Cotton, Gary Kendall
Low cost automatic mixed-signal board test using IEEE 1149.4. ITC (2007)
Bruce C. Kim
Test Technology Newsletter - October 2007. J. Electron. Test. 23 (5) (2007)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 24 (4) (2007)
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
A new low-cost RF built-in self-test measurement for system-on-chip transceivers. IEEE Trans. Instrum. Meas. 55 (2) (2006)
Bruce C. Kim
Test Technology TC Newsletter. IEEE Des. Test Comput. 23 (4) (2006)
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
A Novel RF Test Scheme Based on a DFT Method. J. Electron. Test. 22 (3) (2006)
Bruce C. Kim
TTTC Newsletter. IEEE Des. Test Comput. 23 (6) (2006)
Bruce C. Kim, Yervant Zorian
Guest Editors' Introduction: Big Innovations in Small Packages. IEEE Des. Test Comput. 23 (3) (2006)
Yervant Zorian, Bruce C. Kim
Session Abstract. VTS (2006)
Bruce C. Kim
Test Technology TC Newsletter. IEEE Des. Test Comput. 23 (5) (2006)
Bruce C. Kim
Test Technology Technical Council Newsletter. IEEE Des. Test Comput. 23 (3) (2006)
Venkat Kalyanaraman, Bruce C. Kim, Pramodchandran N. Variyam, Sasikumar Cherubal
DIBPro: Automatic Diagnostic Program Generation Tool. ITC (2006)
Rahim Kasim, Bruce C. Kim, Josef Drobnik
Advanced Mems for High Power Integrated Distribution Systems. ICMENS (2005)
Jee-Youl Ryu, Bruce C. Kim
Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electron. Test. 21 (6) (2005)
Bruce C. Kim
Test Technology Technical Council Newsletter. J. Electron. Test. 21 (2) (2005)
Bruce C. Kim
Test Technology Technical Council Newsletter. J. Electron. Test. 21 (3) (2005)
Jee-Youl Ryu, Bruce C. Kim
Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectron. J. 36 (8) (2005)
Bruce C. Kim
The Newsletter of Test Technology Council of the IEEE Computer Society. J. Electron. Test. 21 (5) (2005)
Jee-Youl Ryu, Bruce C. Kim
A new design for built-in self-test of 5GHz low noise amplifiers. SoCC (2004)
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla
A new BIST scheme for 5GHz low noise amplifiers. ETS (2004)
Kee-Keun Lee, Bruce C. Kim
MEMS Spring Probe for Next Generation Wafer Level Testing. ICMENS (2003)
Kee-Keun Lee, Bruce C. Kim
RF MEMS Switch for Wireless LAN Applications. ICMENS (2003)
Kranthi K. Pinjala, Bruce C. Kim, Pramodchandran N. Variyam
Automatic Diagnostic Program Generation for Mixed Signal Load Board. ITC (2003)
Kee-Keun Lee, Jiping He, Amarjit Singh, Bruce C. Kim
Benzocyclobutene (BCB) Based Intracortical Neural Implant. ICMENS (2003)
Kranthi K. Pinjala, Bruce C. Kim
An Approach for Selection of Test Points for Analog Fault Diagnosis. DFT (2003)
Kyung-Geun Lee, Hyoung-Kyu Song, Mi-Jeong Kim, Sang-Tae Kim, Bruce C. Kim, Young-Hwan You
Impact of Parameter Imbalances on Transmit Diversity OFDM System Performance. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (8) (2003)
Bruce C. Kim, Pinshan Jiang, Se Hyun Park
A probe scheduling algorithm for MCM substrates. ITC (1999)
Bruce C. Kim, Krishna Marella
A Novel Test Methodology for MEMS Magnetic Micromotors. VTS (1999)
Bruce C. Kim, David C. Keezer, Abhijit Chatterjee
A high throughput test methodology for MCM substrates. ITC (1998)
Rongchang Yan, Bruce C. Kim
A Novel Routing Algorithm for MCM Substrate Verification Using Single-Ended Prob. VTS (1998)
Madhavan Swaminathan, Bruce C. Kim, Abhijit Chatterjee
A Survey of Test Techniques for MCM Substrates. J. Electron. Test. 10 (1-2) (1997)
Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC (1997)
Bruce C. Kim, Hisao Fujikawa, Tetsuji Tamaka
An integrated network management system: the design for AIN and B-ISDN. NOMS (1996)
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
Low-cost DC built-in self-test of linear analog circuits using checksums. VLSI Design (1996)
Abhijit Chatterjee, Bruce C. Kim, Naveena Nagi
DC Built-In Self-Test for Linear Analog Circuits. IEEE Des. Test Comput. 13 (2) (1996)
Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan
Low-cost diagnosis of defects in MCM substrate interconnections. VTS (1996)
Bruce C. Kim, Abhijit Chatterjee, Madhavan Swaminathan, David E. Schimmel
A Novel Low-Cost Approach to MCM Interconnect Test. ITC (1995)
Paul J. Bond, Bruce C. Kim, Christopher A. Lee, David E. Schimmel
A Methodology for Generation and Collection of Multiprocessor Traces. MASCOTS (1994)
Philip W. Mathis, Bruce C. Kim
Network Performance Monitoring And Fault Detection On The Gtnet. NOMS (1992)
Bruce C. Kim
Defense data network management system. LCN (1991)