Low-cost DC built-in self-test of linear analog circuits using checksums.
Abhijit ChatterjeeBruce C. KimNaveena NagiPublished in: VLSI Design (1996)
Keyphrases
- analog circuits
- low cost
- fault diagnosis
- digital circuits
- neural network
- low power
- fuzzy logic
- built in self test
- real time
- wavelet packet transform
- digital camera
- search space
- pattern matching
- knowledge acquisition
- software engineering
- transfer function
- linear systems
- single chip
- image processing
- genetic algorithm
- machine learning