Low-cost diagnosis of defects in MCM substrate interconnections.
Bruce C. KimAbhijit ChatterjeeMadhavan SwaminathanPublished in: VTS (1996)
Keyphrases
- low cost
- fault diagnosis
- low power
- model based diagnosis
- defect detection
- automatic diagnosis
- printed circuit boards
- defect classification
- data acquisition
- real time
- clinically relevant
- medical diagnosis
- fault detection
- magnetic recording
- highly efficient
- digital camera
- model based reasoning
- heat flow
- attention deficit hyperactivity disorder
- diagnostic reasoning
- rfid tags
- high density
- high speed
- neural network
- data sets