The Newsletter of Test Technology Council of the IEEE Computer Society.
Bruce C. KimPublished in: J. Electron. Test. (2005)
Keyphrases
- computer society
- springer verlag
- office automation
- data processing
- rapid development
- case study
- real time
- test data
- databases
- cost effective
- software engineering
- information retrieval
- neural network
- computer systems
- cloud computing
- decision making
- personal computer
- artificial intelligence
- technological advances
- real world