TECHNOLOGICAL ADVANCES
Experts
- Jay F. Nunamaker Jr.
- Kinji Mori
- Jim Ryan
- Kelly Rainer
- Peter G. Neumann
- Mark N. Frolick
- Hugh J. Watson
- Yao-Wen Chang
- Theo Theocharides
- Jan Niehues
- Robert O. Briggs
- Xiaodong Lu
- Mohammed Mediani
- Alex Waibel
- Yvonne Rogers
- André Ivanov
- Tugrul U. Daim
- Rick Kazman
- Mitsumasa Koyanagi
- Steven C. Reising
- Sharmila Padmanabhan
- Eunah Cho
- Teresa Herrmann
- Bruce C. Kim
- John F. McDonald
- Mu-Hsuan Huang
- Francesco Osborne
- Sara J. Czaja
- Stephen J. Andriole
- Christian D. Kummerow
- Takafumi Fukushima
- Sorin P. Voinigescu
- Christopher Frauenberger
- Wesley K. Berg
- Enrico Motta
- Kuan-Neng Chen
- Michael Chu
- Daniel D. Garcia
- Ben Shneiderman
Venues
- CoRR
- Sensors
- HICSS
- Computer
- IEEE Access
- Proc. IEEE
- Scientometrics
- Int. J. Technol. Manag.
- Commun. ACM
- J. Electron. Test.
- CHI Extended Abstracts
- IEEE Commun. Mag.
- ICIS
- IEEE J. Solid State Circuits
- CHI
- Technol. Anal. Strateg. Manag.
- AI Soc.
- Microelectron. Reliab.
- IEEE Technol. Soc. Mag.
- AMCIS
- DAC
- ISTAS
- IEEE Trans. Engineering Management
- IGARSS
- IEEE Des. Test Comput.
- Interactions
- IBM J. Res. Dev.
- Comput. Hum. Behav.
- Comput. Law Secur. Rev.
- Remote. Sens.
- SIGUCCS
- OFC
- ECIS
- PACIS
- ICMC
- ACM SIGSOFT Softw. Eng. Notes
- J. Robotics Mechatronics
- SMC
- ITC
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