TECHNOLOGICAL ADVANCES
Experts
- Jay F. Nunamaker Jr.
- Kinji Mori
- Peter G. Neumann
- Mark N. Frolick
- Jim Ryan
- Kelly Rainer
- Hugh J. Watson
- Xiaodong Lu
- Robert O. Briggs
- Jan Niehues
- Theo Theocharides
- Yao-Wen Chang
- Yvonne Rogers
- Alex Waibel
- Mohammed Mediani
- Rick Kazman
- Eunah Cho
- Bruce C. Kim
- André Ivanov
- Sharmila Padmanabhan
- Mitsumasa Koyanagi
- Tugrul U. Daim
- Teresa Herrmann
- Steven C. Reising
- Todd C. Gaier
- Wesley K. Berg
- Francesco Osborne
- Chris J. Myers
- Stephen J. Andriole
- Christopher A. Le Dantec
- Zhimeng Yin
- Takafumi Fukushima
- Thanh-Le Ha
- Sara J. Czaja
- Falk Schreiber
- Sorin P. Voinigescu
- Björn Niehaves
- John F. McDonald
- Hussam Amrouch
Venues
- CoRR
- Sensors
- HICSS
- Computer
- IEEE Access
- Proc. IEEE
- Scientometrics
- Int. J. Technol. Manag.
- Commun. ACM
- J. Electron. Test.
- CHI Extended Abstracts
- IEEE Commun. Mag.
- CHI
- IEEE J. Solid State Circuits
- ICIS
- AI Soc.
- Technol. Anal. Strateg. Manag.
- IEEE Technol. Soc. Mag.
- Microelectron. Reliab.
- AMCIS
- DAC
- IEEE Trans. Engineering Management
- ISTAS
- IGARSS
- Interactions
- Remote. Sens.
- IEEE Des. Test Comput.
- IBM J. Res. Dev.
- PACIS
- Comput. Hum. Behav.
- SIGUCCS
- Comput. Law Secur. Rev.
- OFC
- ECIS
- IRPS
- ICMC
- ACM SIGSOFT Softw. Eng. Notes
- SMC
- IEEE Consumer Electron. Mag.
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