TECHNOLOGICAL ADVANCES
Experts
- Jay F. Nunamaker Jr.
- Kinji Mori
- Mark N. Frolick
- Kelly Rainer
- Peter G. Neumann
- Jim Ryan
- Hugh J. Watson
- Jan Niehues
- Xiaodong Lu
- Yao-Wen Chang
- Robert O. Briggs
- Theo Theocharides
- Alex Waibel
- Yvonne Rogers
- Mohammed Mediani
- Sharmila Padmanabhan
- Steven C. Reising
- Bruce C. Kim
- Mitsumasa Koyanagi
- André Ivanov
- Rick Kazman
- Teresa Herrmann
- Eunah Cho
- Tugrul U. Daim
- Zhimeng Yin
- Christopher Frauenberger
- Bernd Heinemann
- Ben Shneiderman
- Sorin P. Voinigescu
- Todd C. Gaier
- Boon H. Lim
- Francesco Osborne
- Wesley K. Berg
- Takafumi Fukushima
- Falk Schreiber
- Malgorzata Marek-Sadowska
- Michael Chu
- Daniel D. Garcia
- John F. McDonald
Venues
- CoRR
- Sensors
- HICSS
- Computer
- IEEE Access
- Proc. IEEE
- Scientometrics
- Int. J. Technol. Manag.
- Commun. ACM
- CHI Extended Abstracts
- J. Electron. Test.
- IEEE Commun. Mag.
- CHI
- IEEE J. Solid State Circuits
- ICIS
- Technol. Anal. Strateg. Manag.
- AI Soc.
- IEEE Technol. Soc. Mag.
- Microelectron. Reliab.
- AMCIS
- DAC
- IEEE Trans. Engineering Management
- ISTAS
- IGARSS
- Remote. Sens.
- IEEE Des. Test Comput.
- Interactions
- IBM J. Res. Dev.
- PACIS
- SIGUCCS
- Comput. Hum. Behav.
- Comput. Law Secur. Rev.
- OFC
- ECIS
- IRPS
- ICMC
- ACM SIGSOFT Softw. Eng. Notes
- ITC
- J. Robotics Mechatronics
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