A new low-cost RF built-in self-test measurement for system-on-chip transceivers.
Jee-Youl RyuBruce C. KimIboun Taimiya SyllaPublished in: IEEE Trans. Instrum. Meas. (2006)
Keyphrases
- low cost
- hardware and software
- embedded systems
- data acquisition
- built in self test
- cost effective
- radio frequency
- low power
- real time
- relevance feedback
- power consumption
- digital camera
- highly efficient
- single chip
- high speed
- integrated circuit
- data sets
- database
- measurement error
- correlation analysis
- learning algorithm
- databases
- genetic algorithm
- artificial neural networks
- optimal solution