• search
    search
  • reviewers
    reviewers
  • feeds
    feeds
  • assignments
    assignments
  • settings
  • logout

A Survey of Test Techniques for MCM Substrates.

Madhavan SwaminathanBruce C. KimAbhijit Chatterjee
Published in: J. Electron. Test. (1997)
Keyphrases
  • database systems
  • artificial intelligence
  • statistical tests
  • genetic algorithm
  • case study
  • control system
  • test data
  • statistical significance