Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers.

Jee-Youl Ryu Bruce C. Kim

Published in: Microelectron. J. (2005)

Keyphrases

low cost
high speed
built in self test
high noise
low signal to noise ratio
random noise
noise level
statistical tests
circuit design
frequency band
signal to noise ratio
image noise
noise reduction
missing data
noise model
multiscale
digital camera
radio frequency
multiresolution