Prashant Goteti

Publication Activity (10 Years)

Years Active: 1996-2020
Publications (10 Years): 7

Top Topics

Predictive Analytics

Management Practices

Fault Identification

Top Venues

J. Electron. Test.

Publications

Fei Su, Prashant Goteti, Min Zhang
Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics. ITC (2020)
Fei Su, Prashant Goteti, Min Zhang
On Freedom from Interference in Mixed-Criticality Systems: A Causal Learning Approach. ITC (2019)
Rahul Kundu, Fei Su, Prashant Goteti
A Distributed Error and Anomaly Communication Architecture for Analog and Mixed-Signal Systems. J. Electron. Test. 35 (3) (2019)
Fei Su, Prashant Goteti
Improving Analog Functional Safety Using Data-Driven Anomaly Detection. ITC (2018)
Anandh Krishnan, John van Gelder, Mayukh Bhattacharya, Sreejit Chakravarty, Prashant Goteti
Innovative practices on functional testing and fault simulation for FuSa. VTS (2018)
Prashant Goteti, Sreejit Chakravarty
Innovative practices session 6C DFT for functional safety. VTS (2017)
Jyotsna Sequeira, Suriyaprakash Natarajan, Prashant Goteti, Nitin Chaudhary
Fault simulation for analog test coverage. ITC (2016)
Amitava Majumdar, Suriya Natarajan, Stephen K. Sunter, Prashant Goteti, Ke Huang
Innovative practices session 4C: Disruptive solutions in the non-digital world. VTS (2014)
Debesh Bhatta, Ishita Mukhopadhyay, Suriyaprakash Natarajan, Prashant Goteti, Bin Xue
Framework for analog test coverage. ISQED (2013)
Mustafa Berke Yelten, Suriyaprakash Natarajan, Bin Xue, Prashant Goteti
Scalable and efficient analog parametric fault identification. ICCAD (2013)
Giri Devarayanadurg, Mani Soma, Prashant Goteti, Sam D. Huynh
Test set selection for structural faults in analog IC's. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18 (7) (1999)
Bozena Kaminska, Karim Arabi, I. Bell, José L. Huertas, Bruce C. Kim, Adoración Rueda, Mani Soma, Prashant Goteti
Analog and Mixed-Signal Benchmark Circuits-First Release. ITC (1997)
Giri Devarayanadurg, Prashant Goteti, Mani Soma
Hierarchy Based Statistical Fault Simulation of Mixed-Signal ICs. ITC (1996)