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Test set selection for structural faults in analog IC's.
Giri Devarayanadurg
Mani Soma
Prashant Goteti
Sam D. Huynh
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1999)
Keyphrases
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test set
test cases
error rate
training set
test data
random selection
evaluation methodology
training data
class distribution
multi class
fault detection
training and test sets
data sets
model based diagnosis
integrated circuit
fault diagnosis
information retrieval
detection method
feature selection