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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Salil P. Vadhan
- Bhargab B. Bhattacharya
- Pascal Germain
- Dipak Kumar Kole
- Harry Buhrman
- Palash Sarkar
- Hafizur Rahaman
- Zvi Lotker
- Jennifer Dworak
- Seiji Kajihara
- Emilie Morvant
- Shashank Singh
- Zebo Peng
- Edward J. McCluskey
- Petru Eles
- Janusz Rajski
- Amaury Habrard
- Ran El-Yaniv
- Yevgeny Seldin
- Matthias Hamann
- Zhiyuan He
- Matthias Krause
- Michiko Inoue
- Yongyi Su
- Xun Xu
- Robert M. Hierons
- François Laviolette
- Tomokazu Yoneda
- Sariel Har-Peled
- Hideo Fujiwara
- Andrés R. Masegosa
- Nikolai K. Vereshchagin
- Xrysovalantis Kavousianos
- W. Eric Wong
- Akira Taketani
- Alphan Sahin
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- J. Electron. Test.
- VLSI Design
- IEEE Access
- Asian Test Symposium
- DATE
- DFT
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- VTS
- ICML
- J. Mach. Learn. Res.
- J. Syst. Softw.
- IEICE Trans. Inf. Syst.
- ETS
- AAAI
- IEEE Trans. Software Eng.
- IJCNN
- AMIA
- ICSM
- IEEE Trans. Instrum. Meas.
- NIPS
- DAC
- IACR Cryptol. ePrint Arch.
- ICASSP
- EURO-DAC
- IET Comput. Digit. Tech.
- EMBC
- GECCO
- J. Chem. Inf. Model.
- ISSRE
- Inf. Sci.
- ICST
- ISQED
- CEC
- Multim. Tools Appl.
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