RANDOM SELECTION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Salil P. Vadhan
- Pascal Germain
- Bhargab B. Bhattacharya
- Zebo Peng
- Hafizur Rahaman
- Palash Sarkar
- Shashank Singh
- Seiji Kajihara
- Amaury Habrard
- Jennifer Dworak
- Emilie Morvant
- Dipak Kumar Kole
- Janusz Rajski
- Harry Buhrman
- Petru Eles
- Zvi Lotker
- Edward J. McCluskey
- Alexandre Lacasse
- Alphan Sahin
- Ran El-Yaniv
- Robert M. Hierons
- François Laviolette
- Mario Marchand
- Xrysovalantis Kavousianos
- Yongyi Su
- W. Eric Wong
- Zhiyuan He
- Boaz Patt-Shamir
- Kozo Kinoshita
- Matthias Krause
- Andrés R. Masegosa
- Maria K. Michael
- Hideo Fujiwara
- Michiko Inoue
- Matthias Christandl
- Kui Jia
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- VLSI Design
- J. Electron. Test.
- IEEE Access
- DATE
- Asian Test Symposium
- IEEE Trans. Very Large Scale Integr. Syst.
- ATS
- DFT
- VTS
- ICML
- J. Mach. Learn. Res.
- IEICE Trans. Inf. Syst.
- AAAI
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- ETS
- AMIA
- ICST
- ICASSP
- NIPS
- IJCNN
- IEEE Trans. Instrum. Meas.
- J. Chem. Inf. Model.
- CEC
- IJCAI
- Inf. Process. Lett.
- ISQED
- Inf. Sci.
- EURO-DAC
- ICSM
- IACR Cryptol. ePrint Arch.
- IET Comput. Digit. Tech.
- DAC
- GECCO
- ISSRE
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend