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Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Pascal Germain
- Bhargab B. Bhattacharya
- Salil P. Vadhan
- Hafizur Rahaman
- Edward J. McCluskey
- Shashank Singh
- Palash Sarkar
- Amaury Habrard
- Harry Buhrman
- Jennifer Dworak
- Janusz Rajski
- Zebo Peng
- Petru Eles
- Seiji Kajihara
- Emilie Morvant
- Dipak Kumar Kole
- Zvi Lotker
- Xun Xu
- Yevgeny Seldin
- Spyros Tragoudas
- Andrés R. Masegosa
- Robert M. Hierons
- Srimat T. Chakradhar
- Christian Igel
- Stephan Sloth Lorenzen
- Michiko Inoue
- Boaz Patt-Shamir
- Mario Marchand
- Michal Koucký
- Saurabh Sanghvi
- Matthias Krause
- Matthias Hamann
- Yongyi Su
- Ran El-Yaniv
- Sariel Har-Peled
- Xrysovalantis Kavousianos
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- J. Electron. Test.
- VLSI Design
- DATE
- Asian Test Symposium
- IEEE Access
- IEEE Trans. Very Large Scale Integr. Syst.
- DFT
- ATS
- ICML
- J. Mach. Learn. Res.
- VTS
- AAAI
- IEEE Trans. Software Eng.
- J. Syst. Softw.
- IEICE Trans. Inf. Syst.
- ETS
- NIPS
- IJCAI
- GECCO
- ISQED
- Inf. Process. Lett.
- Inf. Sci.
- IJCNN
- ICST
- AMIA
- DAC
- J. Chem. Inf. Model.
- EURO-DAC
- EMBC
- ISSRE
- ICASSP
- IEEE Trans. Instrum. Meas.
- Multim. Tools Appl.
- IET Comput. Digit. Tech.
- CEC
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