RANDOM SELECTION
Experts
- Irith Pomeranz
- Sudhakar M. Reddy
- Krishnendu Chakrabarty
- Salil P. Vadhan
- Pascal Germain
- Bhargab B. Bhattacharya
- Janusz Rajski
- Shashank Singh
- Amaury Habrard
- Zebo Peng
- Hafizur Rahaman
- Dipak Kumar Kole
- Petru Eles
- Seiji Kajihara
- Zvi Lotker
- Harry Buhrman
- Jennifer Dworak
- Palash Sarkar
- Edward J. McCluskey
- Emilie Morvant
- Michal Koucký
- Andrés R. Masegosa
- Maria K. Michael
- Yongyi Su
- Kui Jia
- Zhiyuan He
- Yevgeny Seldin
- Sariel Har-Peled
- Xun Xu
- Christian Igel
- Spyros Tragoudas
- Robert M. Hierons
- Xrysovalantis Kavousianos
- Nikolai K. Vereshchagin
- François Laviolette
- Stelios Neophytou
- Matthias Christandl
- Saurabh Sanghvi
- Ran El-Yaniv
Venues
- CoRR
- IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
- ITC
- IEEE Trans. Computers
- J. Electron. Test.
- VLSI Design
- Asian Test Symposium
- DATE
- IEEE Access
- ATS
- IEEE Trans. Very Large Scale Integr. Syst.
- DFT
- J. Mach. Learn. Res.
- ICML
- VTS
- AAAI
- ETS
- J. Syst. Softw.
- IEICE Trans. Inf. Syst.
- IEEE Trans. Software Eng.
- EMBC
- Multim. Tools Appl.
- J. Chem. Inf. Model.
- AMIA
- IJCAI
- ISQED
- NIPS
- IACR Cryptol. ePrint Arch.
- ICST
- Inf. Sci.
- DAC
- CEC
- IET Comput. Digit. Tech.
- Inf. Process. Lett.
- GECCO
- IEEE Trans. Instrum. Meas.
- IJCNN
- EURO-DAC
- ICASSP
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