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Akira Taketani
Publication Activity (10 Years)
Years Active: 2010-2012
Publications (10 Years): 0
Top Topics
Pattern Matching
Test Set
High Quality
Error Rate
Top Venues
IEICE Trans. Inf. Syst.
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Publications
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Michiko Inoue
,
Akira Taketani
,
Tomokazu Yoneda
,
Hideo Fujiwara
Test Pattern Ordering and Selection for High Quality Test Set under Constraints.
IEICE Trans. Inf. Syst.
(12) (2012)
Michiko Inoue
,
Akira Taketani
,
Tomokazu Yoneda
,
Hiroshi Iwata
,
Hideo Fujiwara
Test pattern selection to optimize delay test quality with a limited size of test set.
ETS
(2010)
Tomokazu Yoneda
,
Michiko Inoue
,
Akira Taketani
,
Hideo Fujiwara
Seed Ordering and Selection for High Quality Delay Test.
Asian Test Symposium
(2010)