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Test pattern selection to optimize delay test quality with a limited size of test set.

Michiko InoueAkira TaketaniTomokazu YonedaHiroshi IwataHideo Fujiwara
Published in: ETS (2010)
Keyphrases
  • test set
  • test data
  • random selection
  • test cases
  • high quality
  • training set
  • error rate
  • database
  • training data
  • data sets
  • image processing
  • pattern matching
  • cross validation