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Test Pattern Ordering and Selection for High Quality Test Set under Constraints.

Michiko InoueAkira TaketaniTomokazu YonedaHideo Fujiwara
Published in: IEICE Trans. Inf. Syst. (2012)
Keyphrases
  • test set
  • random selection
  • high quality
  • test data
  • test cases
  • error rate
  • training set
  • training data
  • pattern matching
  • evaluation methodology
  • data sets
  • class distribution