Seed Ordering and Selection for High Quality Delay Test.

Tomokazu Yoneda Michiko Inoue Akira Taketani Hideo Fujiwara

Published in: Asian Test Symposium (2010)

Keyphrases

high quality
higher quality
image quality
low quality
selection criteria
learning algorithm
information systems
ground truth
selection strategy
random selection
real world
information retrieval
feature selection
high resolution
test data
selection algorithm