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DC Built-In Self-Test for Linear Analog Circuits.

Abhijit ChatterjeeBruce C. KimNaveena Nagi
Published in: IEEE Des. Test Comput. (1996)
Keyphrases
  • analog circuits
  • fault diagnosis
  • digital circuits
  • built in self test
  • neural network
  • low cost
  • wavelet packet transform
  • linear systems
  • knowledge base
  • fuzzy logic
  • closed form