MEMS Spring Probe for Next Generation Wafer Level Testing.

Kee-Keun Lee Bruce C. Kim

Published in: ICMENS (2003)

Keyphrases

levels of abstraction
test cases
higher level
semiconductor manufacturing
data mining
integrated circuit
data sets
user interface
massively parallel
wireless networks
fine grained
learning environment
bayesian networks
high level
three dimensional
learning algorithm
real world