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Low cost automatic mixed-signal board test using IEEE 1149.4.
Srividya Sundar
Bruce C. Kim
Toby Byrd
Felipe Toledo
Sudhir Wokhlu
Erika Beskar
Raul Rousselin
David Cotton
Gary Kendall
Published in:
ITC (2007)
Keyphrases
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low cost
low power
mixed signal
vlsi circuits
single chip
image processing
machine vision
digital camera