A high throughput test methodology for MCM substrates.
Bruce C. KimDavid C. KeezerAbhijit ChatterjeePublished in: ITC (1998)
Keyphrases
- high throughput
- microarray
- biological data
- genome wide
- systems biology
- dna sequencing
- data acquisition
- low latency
- genomic data
- mass spectrometry
- statistical tests
- proteomic data
- protein protein interactions
- real time
- high speed
- gene expression
- complex systems
- data processing
- mass spectrometry data
- image analysis
- pattern recognition